test: Fix typo in a test
Related-To: NEO-3927 Signed-off-by: Kindracki, Jakub Tomasz <jakub.tomasz.kindracki@intel.com>
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@ -1,5 +1,5 @@
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/*
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* Copyright (C) 2018-2024 Intel Corporation
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* Copyright (C) 2018-2025 Intel Corporation
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*
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* SPDX-License-Identifier: MIT
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*
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@ -130,7 +130,7 @@ class MemObjAsyncDestructionTest : public MemObjDestructionTest<> {
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DebugManagerStateRestore restorer;
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};
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class MemObjMulitAllocationAsyncDestructionTest : public MemObjDestructionTest<true> {
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class MemObjMultiAllocationAsyncDestructionTest : public MemObjDestructionTest<true> {
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public:
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void SetUp() override {
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debugManager.flags.EnableAsyncDestroyAllocations.set(true);
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@ -188,7 +188,7 @@ TEST_P(MemObjAsyncDestructionTest, givenMemObjWithDestructableAllocationWhenAsyn
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}
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}
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HWTEST_F(MemObjMulitAllocationAsyncDestructionTest, givenUsedMemObjWithAsyncDestructionsEnabledThatHasMultiGraphicsAllocationWhenItIsDestroyedThenDestructorWaitsOnTaskCount) {
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HWTEST_F(MemObjMultiAllocationAsyncDestructionTest, givenUsedMemObjWithAsyncDestructionsEnabledThatHasMultiGraphicsAllocationWhenItIsDestroyedThenDestructorWaitsOnTaskCount) {
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auto rootDeviceIndex = device->getRootDeviceIndex();
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auto mockCsr0 = new MyCsr<FamilyType>(*device->executionEnvironment, device->getDeviceBitfield());
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auto mockCsr1 = new MyCsr<FamilyType>(*device->executionEnvironment, device->getDeviceBitfield());
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