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Remove usage of TestLegacy from opencl tests

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Signed-off-by: Mateusz Jablonski <mateusz.jablonski@intel.com>
This commit is contained in:
Mateusz Jablonski
2022-08-16 14:51:17 +00:00
committed by Compute-Runtime-Automation
parent 44d218e52e
commit bca852617c
350 changed files with 1295 additions and 1315 deletions
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22
opencl/test/unit_test/sampler/sampler_set_arg_tests.cpp
View File

@ -33,8 +33,8 @@ class SamplerSetArgFixture : public ClDeviceFixture {
}
protected:
void SetUp() {
ClDeviceFixture::SetUp();
void setUp() {
ClDeviceFixture::setUp();
pKernelInfo = std::make_unique<MockKernelInfo>();
pKernelInfo->kernelDescriptor.kernelAttributes.simdSize = 1;
@ -62,12 +62,12 @@ class SamplerSetArgFixture : public ClDeviceFixture {
retVal = CL_INVALID_VALUE;
}
void TearDown() {
void tearDown() {
delete pMultiDeviceKernel;
delete sampler;
delete context;
ClDeviceFixture::TearDown();
ClDeviceFixture::tearDown();
}
bool crossThreadDataUnchanged() {
@ -102,7 +102,7 @@ class SamplerSetArgFixture : public ClDeviceFixture {
Sampler *sampler = nullptr;
};
typedef TestLegacy<SamplerSetArgFixture> SamplerSetArgTest;
typedef Test<SamplerSetArgFixture> SamplerSetArgTest;
HWTEST_F(SamplerSetArgTest, WhenSettingKernelArgSamplerThenSamplerStatesAreCorrect) {
typedef typename FamilyType::SAMPLER_STATE SAMPLER_STATE;
createSampler();
@ -390,10 +390,10 @@ struct NormalizedTest
: public SamplerSetArgFixture,
public ::testing::TestWithParam<uint32_t /*cl_bool*/> {
void SetUp() override {
SamplerSetArgFixture::SetUp();
SamplerSetArgFixture::setUp();
}
void TearDown() override {
SamplerSetArgFixture::TearDown();
SamplerSetArgFixture::tearDown();
}
};
@ -441,10 +441,10 @@ struct AddressingModeTest
: public SamplerSetArgFixture,
public ::testing::TestWithParam<uint32_t /*cl_addressing_mode*/> {
void SetUp() override {
SamplerSetArgFixture::SetUp();
SamplerSetArgFixture::setUp();
}
void TearDown() override {
SamplerSetArgFixture::TearDown();
SamplerSetArgFixture::tearDown();
}
};
@ -560,10 +560,10 @@ struct FilterModeTest
: public SamplerSetArgFixture,
public ::testing::TestWithParam<uint32_t /*cl_filter_mode*/> {
void SetUp() override {
SamplerSetArgFixture::SetUp();
SamplerSetArgFixture::setUp();
}
void TearDown() override {
SamplerSetArgFixture::TearDown();
SamplerSetArgFixture::tearDown();
}
};

2
opencl/test/unit_test/sampler/sampler_tests_xehp_and_later.cpp
View File

@ -15,7 +15,7 @@
using namespace NEO;
using XeHPAndLaterSamplerTest = TestLegacy<ClDeviceFixture>;
using XeHPAndLaterSamplerTest = Test<ClDeviceFixture>;
HWCMDTEST_F(IGFX_XE_HP_CORE, XeHPAndLaterSamplerTest, GivenDefaultThenLowQualityFilterIsDisabled) {
using SAMPLER_STATE = typename FamilyType::SAMPLER_STATE;