compute-runtime/shared/test/unit_test/gen9/sip_tests_gen9.cpp

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1.2 KiB
C++

/*
* Copyright (C) 2018-2023 Intel Corporation
*
* SPDX-License-Identifier: MIT
*
*/
#include "shared/source/built_ins/built_ins.h"
#include "shared/source/built_ins/sip.h"
#include "shared/source/gen9/hw_cmds.h"
#include "shared/test/common/helpers/test_files.h"
#include "shared/test/common/libult/global_environment.h"
#include "shared/test/common/mocks/mock_device.h"
#include "shared/test/common/test_macros/header/per_product_test_definitions.h"
#include "shared/test/common/test_macros/test.h"
#include "gtest/gtest.h"
using namespace NEO;
namespace SipKernelTests {
typedef ::testing::Test gen9SipTests;
GEN9TEST_F(gen9SipTests, givenDebugCsrSipKernelWithLocalMemoryWhenAskedForDebugSurfaceBtiAndSizeThenBtiIsZeroAndSizeGreaterThanZero) {
auto mockDevice = std::unique_ptr<MockDevice>(MockDevice::createWithNewExecutionEnvironment<MockDevice>(nullptr));
EXPECT_NE(nullptr, mockDevice);
auto &builtins = *mockDevice->getBuiltIns();
auto &sipKernel = builtins.getSipKernel(SipKernelType::dbgCsrLocal, *mockDevice);
EXPECT_NE(nullptr, &sipKernel);
EXPECT_EQ(SipKernelType::dbgCsrLocal, sipKernel.getType());
}
} // namespace SipKernelTests