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Change-Id: I4a1e7def6b26241592dba4ecd4a6a6cb3bb69835 Signed-off-by: Filip Hazubski <filip.hazubski@intel.com>
30 lines
708 B
C++
30 lines
708 B
C++
/*
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* Copyright (C) 2018-2020 Intel Corporation
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*
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* SPDX-License-Identifier: MIT
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*
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*/
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#include "shared/test/unit_test/mocks/mock_device.h"
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#include "opencl/test/unit_test/fixtures/device_fixture.h"
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#include "opencl/test/unit_test/mocks/mock_source_level_debugger.h"
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#include "test.h"
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using namespace NEO;
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struct BdwDeviceTest : public DeviceFixture,
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public ::testing::Test {
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void SetUp() override {
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DeviceFixture::SetUp();
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}
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void TearDown() override {
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DeviceFixture::TearDown();
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}
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};
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BDWTEST_F(BdwDeviceTest, givenBdwDeviceWhenAskedForClVersionThenReport21) {
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auto version = pClDevice->getEnabledClVersion();
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EXPECT_EQ(21u, version);
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}
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