mirror of
https://github.com/intel/compute-runtime.git
synced 2025-09-15 13:01:45 +08:00
e245523730
In gen/sku specific tests include only required files to reduce dependency on not related HW scpecific headers and improve build performance. This is achieved by reduce in usage of hw_test.h and related collateral, like shared/source/helpers/definitions/hw_cmds.h which can be replaced by sku specific hw_cmds_<sku>.h Signed-off-by: Artur Harasimiuk <artur.harasimiuk@intel.com>
22 lines
590 B
C++
22 lines
590 B
C++
/*
|
|
* Copyright (C) 2018-2022 Intel Corporation
|
|
*
|
|
* SPDX-License-Identifier: MIT
|
|
*
|
|
*/
|
|
|
|
#include "shared/source/gen9/hw_cmds_bxt.h"
|
|
#include "shared/test/common/test_macros/header/per_product_test_definitions.h"
|
|
#include "shared/test/common/test_macros/test.h"
|
|
|
|
#include "opencl/test/unit_test/fixtures/cl_device_fixture.h"
|
|
|
|
using namespace NEO;
|
|
|
|
typedef Test<ClDeviceFixture> DeviceTest;
|
|
|
|
BXTTEST_F(DeviceTest, givenBxtDeviceWhenAskedForProflingTimerResolutionThen52IsReturned) {
|
|
auto resolution = pDevice->getProfilingTimerResolution();
|
|
EXPECT_DOUBLE_EQ(52.083, resolution);
|
|
}
|