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Setting default device id for acronym
This PR includes: - Move product config implementation from ocloc arg helper to product config helper. - Add default device id setting for each platform configuration. - Add & move hw info config tests from opencl to shared Signed-off-by: Daria Hinz <daria.hinz@intel.com> Related-To: NEO-7112
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Compute-Runtime-Automation
parent
05ad32704b
commit
01af53b63c
@@ -7,10 +7,13 @@
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#include "shared/source/gen8/hw_cmds_bdw.h"
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#include "shared/source/helpers/compiler_hw_info_config.h"
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#include "shared/source/os_interface/hw_info_config.h"
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#include "shared/test/common/helpers/default_hw_info.h"
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#include "shared/test/common/test_macros/header/per_product_test_definitions.h"
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#include "shared/test/common/test_macros/test.h"
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#include "platforms.h"
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using namespace NEO;
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TEST(BdwHwInfoConfig, givenInvalidSystemInfoWhenSettingHardwareInfoThenExpectThrow) {
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@@ -81,6 +84,12 @@ BDWTEST_F(BdwHwInfo, givenHwInfoConfigStringThenAfterSetupResultingVmeIsDisabled
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EXPECT_FALSE(hwInfo.capabilityTable.supportsVme);
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}
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BDWTEST_F(BdwHwInfo, givenHwInfoConfigWhenGetProductConfigThenCorrectMatchIsFound) {
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HardwareInfo hwInfo = *defaultHwInfo;
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const auto &hwInfoConfig = *HwInfoConfig::get(hwInfo.platform.eProductFamily);
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EXPECT_EQ(hwInfoConfig.getProductConfigFromHwInfo(hwInfo), AOT::BDW);
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}
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using CompilerHwInfoConfigHelperTestsBdw = ::testing::Test;
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BDWTEST_F(CompilerHwInfoConfigHelperTestsBdw, givenBdwWhenIsStatelessToStatefulBufferOffsetSupportedIsCalledThenReturnsTrue) {
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EXPECT_FALSE(CompilerHwInfoConfig::get(productFamily)->isStatelessToStatefulBufferOffsetSupported());
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