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fix(sysman): Disable Supported Diagnostics Tests

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The Supported Diagnostics Tests are disabled resulting into no handle
creation for Diagnostics module

Related-To: NEO-13819

Signed-off-by: Pratik Bari <pratik.bari@intel.com>
This commit is contained in:
Pratik Bari
2025-01-30 15:01:02 +00:00
committed by Compute-Runtime-Automation
parent d37943da29
commit 4327f8c832
10 changed files with 38 additions and 141 deletions
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3
level_zero/sysman/test/unit_tests/sources/diagnostics/linux/mock_zes_sysman_diagnostics.h
View File

@@ -1,5 +1,5 @@
/*
* Copyright (C) 2023-2024 Intel Corporation
* Copyright (C) 2023-2025 Intel Corporation
*
* SPDX-License-Identifier: MIT
*
@@ -14,7 +14,6 @@ namespace L0 {
namespace Sysman {
namespace ult {
uint32_t mockDiagHandleCount = 2;
const std::string mockQuiescentGpuFile("quiesce_gpu");
const std::string mockinvalidateLmemFile("invalidate_lmem_mmaps");
const std::vector<std::string> mockSupportedDiagTypes = {"MOCKSUITE1", "MOCKSUITE2"};

66
level_zero/sysman/test/unit_tests/sources/diagnostics/linux/test_zes_sysman_diagnostics.cpp
View File

@@ -1,5 +1,5 @@
/*
* Copyright (C) 2023 Intel Corporation
* Copyright (C) 2023-2025 Intel Corporation
*
* SPDX-License-Identifier: MIT
*
@@ -156,7 +156,9 @@ class ZesDiagnosticsFixture : public SysmanDeviceFixture {
}
};
HWTEST2_F(ZesDiagnosticsFixture, GivenComponentCountZeroWhenCallingzesDeviceEnumDiagnosticTestSuitesThenZeroCountIsReturnedAndVerifyzesDeviceEnumDiagnosticTestSuitesCallSucceeds, IsPVC) {
TEST_F(ZesDiagnosticsFixture, GivenComponentCountZeroWhenCallingZesDeviceEnumDiagnosticTestSuitesThenZeroCountIsReturnedAndVerifyZesDeviceEnumDiagnosticTestSuitesCallSucceeds) {
constexpr uint32_t mockDiagHandleCount = 0;
std::vector<zes_diag_handle_t> diagnosticsHandle{};
uint32_t count = 0;
@@ -177,15 +179,20 @@ HWTEST2_F(ZesDiagnosticsFixture, GivenComponentCountZeroWhenCallingzesDeviceEnum
EXPECT_EQ(ZE_RESULT_SUCCESS, result);
EXPECT_EQ(count, mockDiagHandleCount);
}
std::unique_ptr<L0::Sysman::DiagnosticsImp> ptestDiagnosticsImp = std::make_unique<L0::Sysman::DiagnosticsImp>(pSysmanDeviceImp->pDiagnosticsHandleContext->pOsSysman, mockSupportedDiagTypes[0]);
pSysmanDeviceImp->pDiagnosticsHandleContext->handleList.push_back(std::move(ptestDiagnosticsImp));
result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &count, nullptr);
TEST_F(ZesDiagnosticsFixture, GivenOneSupportedDiagnosticTestWhenCallingZesDeviceEnumDiagnosticTestSuitesThenOneCountIsReturnedAndVerifyZesDeviceEnumDiagnosticTestSuitesCallSucceeds) {
constexpr uint32_t mockDiagHandleCount = 1;
std::vector<zes_diag_handle_t> diagnosticsHandle{};
uint32_t count = 0;
pSysmanDeviceImp->pDiagnosticsHandleContext->supportedDiagTests.push_back(mockSupportedDiagTypes[0]);
ze_result_t result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &count, nullptr);
EXPECT_EQ(ZE_RESULT_SUCCESS, result);
EXPECT_EQ(count, mockDiagHandleCount);
testCount = count;
uint32_t testCount = count;
diagnosticsHandle.resize(testCount);
result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &testCount, diagnosticsHandle.data());
@@ -197,30 +204,6 @@ HWTEST2_F(ZesDiagnosticsFixture, GivenComponentCountZeroWhenCallingzesDeviceEnum
pSysmanDeviceImp->pDiagnosticsHandleContext->handleList.pop_back();
}
HWTEST2_F(ZesDiagnosticsFixture, GivenComponentCountZeroWhenCallingzesDeviceEnumDiagnosticTestSuitesThenZeroCountIsReturnedAndVerifyzesDeviceEnumDiagnosticTestSuitesCallSucceeds, IsNotPVC) {
mockDiagHandleCount = 0;
std::vector<zes_diag_handle_t> diagnosticsHandle{};
uint32_t count = 0;
ze_result_t result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &count, nullptr);
EXPECT_EQ(ZE_RESULT_SUCCESS, result);
EXPECT_EQ(count, mockDiagHandleCount);
uint32_t testCount = count + 1;
result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &testCount, nullptr);
EXPECT_EQ(ZE_RESULT_SUCCESS, result);
EXPECT_EQ(testCount, count);
diagnosticsHandle.resize(count);
result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &count, diagnosticsHandle.data());
EXPECT_EQ(ZE_RESULT_SUCCESS, result);
EXPECT_EQ(count, mockDiagHandleCount);
}
TEST_F(ZesDiagnosticsFixture, GivenValidDiagnosticsHandleWhenGettingDiagnosticsPropertiesThenCallSucceeds) {
clearAndReinitHandles();
@@ -727,7 +710,9 @@ TEST_F(ZesDiagnosticsFixture, GivenValidSysmanImpPointerWhenCallingReleaseSysman
EXPECT_EQ(ZE_RESULT_SUCCESS, pLinuxSysmanImp->reInitSysmanDeviceResources());
}
HWTEST2_F(ZesDiagnosticsFixture, GivenValidDiagnosticsHandleAndHandleCountZeroWhenCallingReInitThenValidCountIsReturnedAndVerifyzesDeviceEnumDiagnosticTestSuitesSucceeds, IsPVC) {
TEST_F(ZesDiagnosticsFixture, GivenValidDiagnosticsHandleAndHandleCountZeroWhenCallingReInitThenZeroCountIsReturnedAndVerifyZesDeviceEnumDiagnosticTestSuitesSucceeds) {
constexpr uint32_t mockDiagHandleCount = 0;
uint32_t count = 0;
ze_result_t result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &count, nullptr);
EXPECT_EQ(ZE_RESULT_SUCCESS, result);
@@ -745,25 +730,6 @@ HWTEST2_F(ZesDiagnosticsFixture, GivenValidDiagnosticsHandleAndHandleCountZeroWh
EXPECT_EQ(count, mockDiagHandleCount);
}
HWTEST2_F(ZesDiagnosticsFixture, GivenValidDiagnosticsHandleAndHandleCountZeroWhenCallingReInitThenValidCountIsReturnedAndVerifyzesDeviceEnumDiagnosticTestSuitesSucceeds, IsNotPVC) {
uint32_t count = 0;
mockDiagHandleCount = 0;
ze_result_t result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &count, nullptr);
EXPECT_EQ(ZE_RESULT_SUCCESS, result);
EXPECT_EQ(count, mockDiagHandleCount);
pSysmanDeviceImp->pDiagnosticsHandleContext->handleList.clear();
pSysmanDeviceImp->pDiagnosticsHandleContext->supportedDiagTests.clear();
pLinuxSysmanImp->diagnosticsReset = false;
pLinuxSysmanImp->reInitSysmanDeviceResources();
count = 0;
result = zesDeviceEnumDiagnosticTestSuites(device->toHandle(), &count, nullptr);
EXPECT_EQ(ZE_RESULT_SUCCESS, result);
EXPECT_EQ(count, mockDiagHandleCount);
}
} // namespace ult
} // namespace Sysman
} // namespace L0