Mateusz Hoppe 3b93e23156 test: improve test coverage ...

- in decodeSingleDeviceBinary()
- in ImplicitArgs

Signed-off-by: Mateusz Hoppe <mateusz.hoppe@intel.com>

2025-09-24 15:16:27 +02:00

..

ar

refactor: fix typos

2025-09-22 12:46:41 +02:00

elf

refactor: modernizing NEO::Range->std::span

2025-07-17 01:27:11 +02:00

yaml

fix: Fix compiler errors in ULTs

2025-09-03 14:50:58 +02:00

CMakeLists.txt

feature: Add interface for Ext area regarding payload args in zebin spec

2025-07-25 15:34:25 +02:00

device_binary_format_ar_tests.cpp

refactor: correct naming of enum class constants 8/n

2023-12-19 08:18:18 +01:00

device_binary_format_ocl_elf_tests.cpp

feature: Adding elf rewriter utility

2024-05-20 13:44:11 +02:00

device_binary_format_patchtokens_tests.cpp

refactor: correct naming of enum class constants 8/n

2023-12-19 08:18:18 +01:00

device_binary_format_zebin_tests.cpp

refactor: fix typos

2025-09-22 12:46:41 +02:00

device_binary_formats_tests.cpp

fix: disable support for deprecated patchtokens format

2025-09-24 12:44:12 +02:00

patchtokens_decoder_tests.cpp

refactor: remove not needed logic related to vme

2025-07-11 17:02:48 +02:00

patchtokens_dumper_tests.cpp

refactor: fix typos

2025-09-22 12:46:41 +02:00

patchtokens_validator_tests.cpp

refactor: correct naming of enum class constants 5/n

2023-12-13 10:06:02 +01:00

zebin_debug_binary_tests.cpp

refactor: fix typos

2025-09-22 12:46:41 +02:00

zebin_decoder_exclusive_tests.cpp

refactor: Introducing common ext pattern

2025-07-28 18:01:22 +02:00

zebin_decoder_tests.cpp

test: improve test coverage

2025-09-24 15:16:27 +02:00