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e5a18177c5
Separate unit test helper definitions bdw_and_later / xe_hp_and_later Related-To: NEO-6466 Signed-off-by: Mateusz Jablonski <mateusz.jablonski@intel.com>
39 lines
841 B
C++
39 lines
841 B
C++
/*
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* Copyright (C) 2021-2022 Intel Corporation
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*
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* SPDX-License-Identifier: MIT
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*
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*/
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#include "shared/source/gen11/hw_info.h"
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#include "shared/test/common/helpers/unit_test_helper.h"
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#include "shared/test/common/helpers/unit_test_helper.inl"
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#include "shared/test/common/helpers/unit_test_helper_bdw_and_later.inl"
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namespace NEO {
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using Family = ICLFamily;
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template <>
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uint32_t UnitTestHelper<Family>::getDebugModeRegisterOffset() {
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return 0x20d8;
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}
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template <>
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uint32_t UnitTestHelper<Family>::getDebugModeRegisterValue() {
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return (1u << 5) | (1u << 21);
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}
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template <>
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uint32_t UnitTestHelper<Family>::getTdCtlRegisterOffset() {
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return 0xe400;
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}
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template <>
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uint32_t UnitTestHelper<Family>::getTdCtlRegisterValue() {
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return (1u << 7) | (1u << 4);
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}
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template struct UnitTestHelper<ICLFamily>;
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} // namespace NEO
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